Adequacy of the Lifshitz theory for certain thin adsorbed films.

نویسندگان

  • Panella
  • Chiarello
  • Krim
چکیده

We have employed a quartz crystal microbalance technique to study the thickness versus pressure dependence of a variety of thin (0–5 nm) liquid films (water, cyclohexane, nitrogen, krypton, and xenon) adsorbed on metal surfaces. We observe the Lifshitz theory of van der Waals forces to provide an excellent description of nitrogen adsorption, and an inadequate description of water adsorption, with the remaining gases spanning the two extremes.

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Simple Semiempirical Method of Calculating van der "Waals Interactions in Thin Films from Lifshitz Theory

für Naturforschung in cooperation with the Max Planck Society for the Advancement of Science under a Creative Commons Attribution 4.0 International License. Dieses Werk wurde im Jahr 2013 vom Verlag Zeitschrift für Naturforschung in Zusammenarbeit mit der Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. digitalisiert und unter folgender Lizenz veröffentlicht: Creative Commons Namen...

متن کامل

Investigation of extinction spectra of THTS Mn thin films and comparsion with discrete dipole approximation simulation results

In this work, the extinction spectra of the nano-structure of the Tilt Helical and Stair-like Towers of Mn thin films were obtained using discrete dipole approximation (DDA) simulation for both s-and p-polarization at two incident light angles of 10°, and 60° at different azimuthal angles for the there samples with different tilt. Obtained results are compared with the experimental optical exti...

متن کامل

OPTICAL PROPERTIES OF THIN Cu FILMS AS A FUNCTION OF SUBSTRATE TEMPERATURE

Copper films (250 nm) deposited on glass substrates, at different substrate temperatures. Their optical properties were measured by ellipsometery (single wavelength of 589.3 nm) and spectrophotometery in the spectral range of 200–2600 nm. Kramers Kronig method was used for the analysis of the reflectivity curves of Cu films to obtain the optical constants of the films, while ellipsometery measu...

متن کامل

Preparation of Nanocrystalline CdS Thin Films by a New Chemical Bath Deposition Route for Application in Solar Cells as Antireflection Coatings

Nanocrystalline cadmium sulfide thin films as antireflection materials for solar cells have been prepared by a new chemical solution deposition route in an aqueous medium at 50 °C. as-deposited thin films were studied using X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), and optical absorption spectra. X-ray diffraction data indicated the formation of hexagonal na...

متن کامل

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

عنوان ژورنال:
  • Physical review letters

دوره 76 19  شماره 

صفحات  -

تاریخ انتشار 1996